GD32E517

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Overview

The GD32E517 is the product line that offers Ethernet support within the GD32E5xx product series. Its main frequency is up to 180MHz, and it supports up to 512K Flash and 128K SARM. It also integrates CAN2.0B, USB HS OTG, TMU (Trigonometric Math Unit), HRTIM (High-Resolution Timer), Comparator, EXMC (External Memory Controller) as well as other digital and analog peripheral resources.

The GD32E517 product line provides LQFP64, LQFP100, and LQFP144 package options.

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Part No	Core	Series	Package LQFP64 LQFP144 LQFP100	Max Speed (MHz)	Flash (Bytes) 256K 512K	SRAM (Bytes) 96K 128K	I/O up to 80 up to 51 up to 112	GPTM (32bit)	GPTM (16bit) ≥ ≤	Advanced TM (16bit) ≥ ≤	HRTM	Basic TM (16bit)	SysTick (24bit)	WDG	RTC	USART+UART	I2C	SPI	I2S	CAN 2.0B	USB 2.0	Ethernet	SDIO	TMU	EXMC ≥ ≤	12bit ADC Units (CHs) 3(21) 3(16)	12bit DAC Units	Comp
GD32E517RCT6	Cortex®-M33	GD32E517	LQFP64	180	256K	96K	up to 51	1	6	1	1	2	1	2	1	4+2	3	3	2	3	(FS+HS) OTG	1	1	1	0	3(16)	3	3
GD32E517RET6	Cortex®-M33	GD32E517	LQFP64	180	512K	128K	up to 51	1	12	2	1	2	1	2	1	4+2	3	3	2	3	(FS+HS) OTG	1	1	1	0	3(16)	3	3
GD32E517VCT6	Cortex®-M33	GD32E517	LQFP100	180	256K	96K	up to 80	1	6	1	1	2	1	2	1	4+2	3	3	2	3	(FS+HS) OTG	1	1	1	1	3(16)	3	3
GD32E517VET6	Cortex®-M33	GD32E517	LQFP100	180	512K	128K	up to 80	1	12	2	1	2	1	2	1	4+2	3	3	2	3	(FS+HS) OTG	1	1	1	1	3(16)	3	3
GD32E517ZCT6	Cortex®-M33	GD32E517	LQFP144	180	256K	96K	up to 112	1	6	2	1	2	1	2	1	4+2	3	3	2	3	(FS+HS) OTG	1	1	1	1	3(21)	3	3
GD32E517ZET6	Cortex®-M33	GD32E517	LQFP144	180	512K	128K	up to 112	1	12	2	1	2	1	2	1	4+2	3	3	2	3	(FS+HS) OTG	1	1	1	1	3(21)	3	3

Documentation

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User Manual

Application Note

Datasheet（1）
Title

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CN

Date
- DS-GD32E517xx-Datasheet-Rev1.0
  
  2024-06-03
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User Manual（1）
Title

EN

CN

Date
- GD32E51x-User-Manual-Rev1.2
  
  2024-06-03
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Application Note（12）
Title

EN

CN

Date
- AN218 Migration from GD32E5xx to GD32G5xx series
  
  2024-11-12
- AN205 Differences between GD32E51x and GD32E50x products
  
  2024-06-27
- AN128 IEC61000-4-4 System level EFT Test
  
  2023-08-28
- AN127 IEC61000-4-2 System-Level ESD Test
  
  2023-08-28
- AN105 GD32 MCU Power Consumption Testing Process
  
  2023-08-28
- AN095 Methods to improve the accuracy of the GD32 MCU temperature sensor
  
  2024-06-04
- AN092 GD32 MCU GPIO structure and precautions_Rev1.4
  
  2024-9-26
- AN089 GD32 TSI TouchKey Software Library User Guide
  
  2023-08-28
- AN078 GD32E5xx Hardware Development Guide
  
  2024-06-06
- AN077 Process description about USB suspend and wake up
  
  2023-08-28
- AN075 Introduction of library invocation scheme based on MDK implementation
  
  2023-08-28
- AN073 Proper use of UID for firmware protection
  
  2023-08-28
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